List of Beamlines by Number

BeamlineTechnique(s)Energy RangeSpokesperson
U1A Auger spectroscopy
X-ray absorption spectroscopy
270-900 eV Steven Hulbert
U2A Infrared microspectroscopy
High Pressure Research
Infrared vibrational spectroscopy
30-10000cm-1 (to 40000cm-1 with visible light) G Carr
U2B InSynC - Education
Infrared microspectroscopy
500-4000 cm-1 Lisa Miller
U3B Visible Stephen Kramer
U3C Metrology
50-1000 eV Kenneth Moy
U4A Ultraviolet photoelectron spectroscopy
10-250 eV Joseph Dvorak
U4B X-ray reflectivity
X-ray scattering, magnetic
X-ray scattering, resonant
Magnetic circular dichroism
X-ray absorption spectroscopy
X-ray fluorescence spectroscopy
20-1200 eV Dario Arena
U4IR Infrared microspectroscopy
Infrared transmission and reflection spectroscopy
Time-resolved spectroscopy
2 meV to 2.0 eV G Carr
U5 Visible white light Stephen Kramer
U5UA Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
15-150 eV Elio Vescovo
U7A X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
X-ray photoelectron spectroscopy
180-1200 eV Daniel Fischer
U8B Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
100-1000 eV Daniel Fischer
U9B Magnetic circular dichroism
Time-resolved spectroscopy
Ultra violet circular dichroism
Ultraviolet florescence spectroscopy
0.8 - 8.0 eV Steven Hulbert
U10B InSynC - Education
Infrared microspectroscopy
500-4000 cm-1 Lisa Miller
U11 Ultra violet circular dichroism
3-10 eV Steven Hulbert
U12A X-ray absorption spectroscopy
X-ray photoelectron spectroscopy
100-800 eV David Mullins
U12IR Infrared microspectroscopy
Infrared transmission and reflection spectroscopy
Magnetospectroscopy
THz / millimeter wave spectroscopy
Time-resolved spectroscopy
4 meV to 750 meV (30 cm-1 to 6000 cm-1) G Carr
U13UB Ultraviolet photoelectron spectroscopy
Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
3-30 eV Peter Johnson
U14B Metrology
white Steven Hulbert
U15 Metrology
100-1000 eV Steven Hulbert
X1A1 X-ray photoelectron spectroscopy
.25-.80 keV George Flynn
X1A2 X-ray scattering, resonant
.25-800 keV John Hill
X1B X-ray absorption spectroscopy
X-ray fluorescence spectroscopy
X-ray photoelectron spectroscopy
.2-1.6 keV Peter Abbamonte
X2A  
X2B X-ray microtomography
8-35 keV David Siddons
X3A Multi wavelength anomalous diffraction
Macromolecular crystallography
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
7.4 - 23 keV Mark Chance
X3B X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
3.8-13.5 keV (4.8 - 13 standard) Mark Chance
X4A Multi wavelength anomalous diffraction
Macromolecular crystallography
3.5-20 keV Wayne Hendrickson
X4C Multi wavelength anomalous diffraction
Macromolecular crystallography
7-20 keV Wayne Hendrickson
X6A Multi wavelength anomalous diffraction
Macromolecular crystallography
6.0-23 keV or 2.1 to 0.54 angstroms Vivian Stojanoff
X6B X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity
6.5-19 keV Elaine Dimasi
X7A White beam David Siddons
X7B X-ray diffraction, single crystal
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray scattering, wide angle
25-50KeV Sanjaya Senanayake
X8A Metrology
1.0-5.9 keV Kenneth Moy
X8C Transmission x-ray microscope
5-11 keV Jun Wang
X9 X-ray Scattering, biomolecular solution
X-ray scattering, small angle
X-ray scattering, wide angle
2.1-20keV (limted by the detector) Lin Yang
X11A X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
4.5-40 keV William O'Grady
X11B X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, near edge structure
5.0-23 keV William O'Grady
X12A 5-50 keV David Siddons
X12B Multi wavelength anomalous diffraction
Macromolecular crystallography
5-20 keV Dieter Schneider
X13A X-ray scattering, magnetic
X-ray scattering, resonant
Magnetic circular dichroism
.2-1.6 keV Dario Arena
X13B Microdiffraction Imaging
9-16 KeV Kenneth Evans-Lutterodt
X14A Multi wavelength anomalous diffraction
X-ray diffraction, powder
X-ray diffraction, single crystal
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray reflectivity
6-22 keV Jianming Bai
X15A Diffraction enhanced imaging
10-60keV Zhong Zhong
X15B X-ray microprobe
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
X-ray fluorescence spectroscopy
1.2-8 keV, standard 2-5 Paul Northrup
X16A Metrology
X-ray inelastic scattering
  Zhong Zhong
X16B X-ray diffraction, powder
X-ray diffraction, single crystal
X-ray reflectivity
X-ray scattering, wide angle
7.6 keV Christie Nelson
X16C X-ray diffraction, powder
6.5-25 keV Peter Stephens
X17A   Lars Ehm
X17B1 X-ray diffraction, powder
55 - 100 keV monochromatic / 20-150 keV white Zhong Zhong
X17B2 X-ray diffraction, powder
X-ray diffraction, time resolved
High Pressure Research
Hard X-ray (20-130 keV) Zhong Zhong
X17B2ss High Pressure Research
Hard X-ray (20-130 keV) Zhong Zhong
X17B3 X-ray diffraction, powder
High Pressure Research
20-150 keV, 30 and 80 keV monochromatic Zhong Zhong
X17C X-ray diffraction, powder
X-ray diffraction, single crystal
High Pressure Research
5-80 keV Zhong Zhong
X18A X-ray diffraction, powder
X-ray absorption spectroscopy
5-25 keV Steven Ehrlich
X18B X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
4.7-40 keV Syed Khalid
X19A X-ray scattering, resonant
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
2.1-17 keV Syed Khalid
X19C X-ray topography
6-40 keV Michael Dudley
X20A X-ray diffraction, single crystal
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
4.5-13 keV Jean Jordan-Sweet
X20C X-ray diffraction, time resolved
7-11 keV (Si(111));4-11 keV (multilayers) Jean Jordan-Sweet
X21 X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray scattering, magnetic
X-ray scattering, resonant
X-ray scattering, surface
X-ray scattering, wide angle
6-16 keV Christie Nelson
X22A X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
X-ray scattering, wide angle
10.7 keV (nom) and 32keV Nathalie Bouet
X22B X-ray scattering, liquid
8 keV (fixed energy) John Hill
X22C X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray reflectivity
X-ray scattering, resonant
3-12 keV John Hill
X23A2 X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
4.7-30 keV Joseph Woicik
X24A X-ray diffraction, standing waves
Auger spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray photoelectron spectroscopy
1.8-6 keV Daniel Fischer
X25 Multi wavelength anomalous diffraction
Macromolecular crystallography
5-20 keV Robert Sweet
X26A InSynC - Education
Microdiffraction Imaging
X-ray microprobe
3-30 keV Stephen Sutton
X26C Multi wavelength anomalous diffraction
Macromolecular crystallography
Ultraviolet photo absorption spectroscopy
5-20 keV Allen Orville
X27A X-ray microprobe
3.8-32 keV Ryan Tappero
X27B High aspect ratio microsystems technology
8 - 40 keV Ralph James
X27C X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray scattering, small angle
X-ray scattering, wide angle
9 KeV Tadanori Koga
X28B X-ray microprobe
~7 KeV Boris Podobedov
X28C X-ray Footprinting
Focused White Beam Mark Chance
X29A Multi wavelength anomalous diffraction
Macromolecular crystallography
6-15keV Robert Sweet
X30   Boris Podobedov