List of PRT Beamlines by Number

BeamlineTechnique(s)Energy RangeSpokesperson
U3C Metrology
50-1000 eV Kenneth Moy
U7A X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
X-ray photoelectron spectroscopy
180-1200 eV Daniel Fischer
U8B Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
100-1000 eV Daniel Fischer
U11 Ultra violet circular dichroism
3-10 eV Steven Hulbert
U12A X-ray absorption spectroscopy
X-ray photoelectron spectroscopy
100-800 eV David Mullins
U13UB Ultraviolet photoelectron spectroscopy
Ultraviolet photoelectron spectroscopy (UPS), angle-resolved
3-30 eV Peter Johnson
X1A1 X-ray photoelectron spectroscopy
.25-.80 keV George Flynn
X1A2 X-ray scattering, resonant
.25-800 keV John Hill
X1B X-ray absorption spectroscopy
X-ray fluorescence spectroscopy
X-ray photoelectron spectroscopy
.2-1.6 keV Peter Abbamonte
X2B X-ray microtomography
8-35 keV David Siddons
X3A Multi wavelength anomalous diffraction
Macromolecular crystallography
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
7.4 - 23 keV Mark Chance
X3B X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
3.8-13.5 keV (4.8 - 13 standard) Mark Chance
X4A Multi wavelength anomalous diffraction
Macromolecular crystallography
3.5-20 keV Wayne Hendrickson
X4C Multi wavelength anomalous diffraction
Macromolecular crystallography
7-20 keV Wayne Hendrickson
X7B X-ray diffraction, single crystal
X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray scattering, wide angle
25-50KeV Sanjaya Senanayake
X8A Metrology
1.0-5.9 keV Kenneth Moy
X11A X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
4.5-40 keV William O'Grady
X11B X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, near edge structure
5.0-23 keV William O'Grady
X15B X-ray microprobe
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
X-ray fluorescence spectroscopy
1.2-8 keV, standard 2-5 Paul Northrup
X16C X-ray diffraction, powder
6.5-25 keV Peter Stephens
X19C X-ray topography
6-40 keV Michael Dudley
X20A X-ray diffraction, single crystal
X-ray diffraction, wide angle
X-ray reflectivity
X-ray scattering, surface
4.5-13 keV Jean Jordan-Sweet
X20C X-ray diffraction, time resolved
7-11 keV (Si(111));4-11 keV (multilayers) Jean Jordan-Sweet
X22B X-ray scattering, liquid
8 keV (fixed energy) John Hill
X22C X-ray diffraction, single crystal
X-ray diffraction, surface
X-ray reflectivity
X-ray scattering, resonant
3-12 keV John Hill
X23A2 X-ray diffraction, anomalous fine structure
X-ray absorption spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray absorption spectroscopy, fine structure
X-ray absorption spectroscopy, near edge fine structure
X-ray absorption spectroscopy, near edge structure
4.7-30 keV Joseph Woicik
X24A X-ray diffraction, standing waves
Auger spectroscopy
X-ray absorption spectroscopy, extended fine structure
X-ray photoelectron spectroscopy
1.8-6 keV Daniel Fischer
X26A InSynC - Education
Microdiffraction Imaging
X-ray microprobe
3-30 keV Stephen Sutton
X27B High aspect ratio microsystems technology
8 - 40 keV Ralph James
X27C X-ray diffraction, time resolved
X-ray diffraction, wide angle
X-ray scattering, small angle
X-ray scattering, wide angle
9 KeV Tadanori Koga
X28C X-ray Footprinting
Focused White Beam Mark Chance