Beamline 12-ID

  • General Information
    • Source Type
      In vacuum undulator. Canted beamline with initial source installed inboard/downstream.

      Status
      Construction and Commissioning

      General User Beamtime
      0%

      Energy Range Category
      Hard X-Ray (1-50 keV)

      Energy Range
      2.1-24 keV

      Beamline Type
      Facility Beamline

      Beamline Description
      The Soft Matter Interfaces beamline will provide Grazing-Incidence SAXS/WAXS and Liquid Interface x-ray scattering capabilities with energy range 2.1-24 keV. SMI is part of the NEXT project and is scheduled for commissioning in September 2016.

      Technique(s)
      X-ray Diffraction, Surface

      Research Types
      Soft Matter Interfaces: soft / bio-materials, polymers, liquid crystals, liquid surfaces. Nanowetting, Langmuir films, organic phases on surfaces, in-situ organic phase transformations, thin films, DNA/RNA/polypeptide composites.

  • Contact Information
    • Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
      Elaine Dimasi, Brookhaven National Laboratory, dimasi@bnl.gov, 344-2211

      Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
      Mikhail Zhernenkov, Brookhaven National Laboratory, zherne@bnl.gov, 344-5158

      Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.

      Beamline Phone
      631-344-

  • Instrumentation
    • Beamline Characteristics

      Energy RangeMono Crystal or GratingResolution (ΔE/E)FluxSpot Size (mm)Total Angular Acceptance (mrad)
      2.1-24 keV Si(111 ) > 1e13 predicted in focused spot V=2.5, 15, or 25 µm; H = 25 or 150 µm < 290 µrad (microbeam) or < 20 µrad (low divergence)
      These figures of merit vary with energy and scattering configuration. Please see external links for details as soon as they become available, or contact SMI staff.

      Source Type
      In vacuum undulator. Canted beamline with initial source installed inboard/downstream.

      Optical System
      Separate H and V Mirror focus over entire energy range. Refractive focus tbd. Primary focus at Liquid Spectrometer or at GISAXS sample in low divergence mode or microfocus mode with additional optics.

      Experimental Apparatus
      Sample vacuum and environmental chamber; Microfluidics; Langmuir troughs; custom user systems.

      Computer System Hardware & Software
      Controls: Linux PC. User support: Windows 7 PC.

  • Links