Beamline 18-ID

  • General Information
    • Source Type
      damping wiggler (DW100)

      Status
      Construction and Commissioning

      General User Beamtime
      0%

      Energy Range Category
      Hard X-Ray (1-50 keV)

      Energy Range
      5-11 keV

      Beamline Type
      Facility Beamline

      Beamline Description
      FXI will house a Transmission X-ray Microscope (TXM) with 30 nm spatial resolution and 20-40 micron field of view. At 500 mA NSLS-II operation, the expected exposure time per image is < 100 ms. The TXM is also capable of nanoXANES, which will allow for the identification of chemical states of some elements. The FXI beamline is in the contingency scope of the NEXT project

      Technique(s)
      Transmission X-ray Microscopy

      Research Types
      Transmission X-ray Microscope

  • Contact Information
    • Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
      Wah-Keat Lee, Brookhaven National Laboratory, wklee@bnl.gov, 344-4085

      Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.

      Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.

      Beamline Phone
      631-344-

  • Instrumentation
    • Beamline Characteristics

      Energy RangeMono Crystal or GratingResolution (ΔE/E)FluxSpot Size (mm)Total Angular Acceptance (mrad)
      5-11 keV Si (111) DCM Energy resolution = 1.4 x 10-4 20-40 microns

      Source Type
      damping wiggler (DW100)

      Optical System
      Collimating mirror - DCM - Toroidal mirror. Energy bandwidth is Si(111) or ~ 1.4 x 10-4. Toroidal mirror focuses beam onto a secondary source (~ 260 um H x 240 um V) about 2 m upstream of the TXM. The TXM condenser will focus the secondary source to about 12-14 um spot on the sample. Condenser agitation or a beam disperser will increase the focus size on the sample to ~ 20-40 um field of view.

      Experimental Apparatus
      Transmission X-ray Microscope (XRADIA). 30 nm spatial resolution. 20-40 micron field of view. Some in-situ sample environmental cells are available.

      Computer System Hardware & Software
      Proprietary XRADIA controls software

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