Beamline 2-ID

  • General Information
    • Source Type
      EPU, 57-mm period, 3.5-m magnetic length

      Construction and Commissioning

      General User Beamtime

      Energy Range Category
      Soft X-Ray (0.1-1 keV)

      Energy Range
      165 to 2300 eV

      Beamline Type
      Facility Beamline

      Beamline Description
      The SIX beamline will allow resonant inelastic x-ray scattering studies of electronic excitations with ultrahigh energy resolution and continuous momentum tunability. The energy range is 165 to 2300 eV, with linear vertical and circular polarizations available down to 275 eV, and linear horizontal polarization available down to 165 eV. Four energy resolution modes will be made available, medium (90 meV at 1 keV), medium-high (50 meV at 1 keV), high (30 meV at 1 keV), and ultrahigh (14 meV at 1keV). The angle of the spectrometer arm with respect to the incident beam will be tunable between 30 and 150 degrees.

      X-ray Absorption Spectroscopy
      X-ray Inelastic Scattering

      Research Types
      High-temperature superconductors, photovoltaic devices, spintronic devices.

  • Contact Information
    • Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
      Ignace Jarrige, Brookhaven National Laboratory,, 344-8814

      Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
      Valentina Bisogni, Brookhaven National Laboratory,, 344-3163
      Joseph Dvorak, Brookhaven National Laboratory,, 344-5135

      Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
      Ignace Jarrige, Brookhaven National Laboratory,, 344-8814

      Beamline Phone

  • Instrumentation
    • Beamline Characteristics

      Energy RangeMono Crystal or GratingResolution (ΔE/E)FluxSpot Size (mm)Total Angular Acceptance (mrad)
      165 to 2300 eV 500, 1200, 1800 l/mm on beamline, 1250 and 2500 l/mm on spectrometer 70,000, 35,000, 20,000, or 14,000 resolving power (RP) 3x10^11 photons/sec at 70,000 RP, 1x10^12 photons/sec at 35,000 RP, 8x10^12 photons/sec at 14,000 RP 6 um (H) x 0.6 um (V) FWHM

      Source Type
      EPU, 57-mm period, 3.5-m magnetic length

      Optical System
      A plane, internally cooled mirror (M1) deflects the beam horizontally to the PGM, which consists of an internally cooled plane pre-mirror (M2) and a set of three VLS gratings. The gratings disperse and focus the beam vertically onto the exit slit. A horizontally focusing mirror (M3), with an elliptical figure, focuses the beam horizontally onto the exit slit. An ellipsoidal mirror (M4) is used to focus the secondary source from the exit slit onto the sample spot. The spectrometer consists of two optical branches mirroring each other to double the throughput. Each branch consists of a horizontally collimating parabolic mirror (M5), a vertical focusing mirror (M6) with a circular cylindrical figure, a vertically deflecting plane mirror (M7), a set of two VLS gratings, and a CCD. The optical scheme of the spectrometer relies on the Hettrick-Underwood scheme.

      Experimental Apparatus
      Sample diffractometer with 6 degrees of freedom, coupled to a cryostat for cooling.

      Computer System Hardware & Software
      Python/EPICS based beamline controls and data acquisition.

  • Links