Beamline 21-ID

  • General Information
    • Source Type
      Two in-line undulators: EPU105, EPU57.


      General User Beamtime

      Energy Range Category
      Soft X-Ray (0.1-1 keV)

      Energy Range
      15 - 1500 eV

      Beamline Type
      Participating Research Team (PRT)

      Beamline Description
      ESM is a soft X-ray beamline optimized for spatially-resolved photoemission microscopy. Two branches: µ‐SARPES, XPEEM

      X-ray Absorption Micro/Nanoprobe
      Ultraviolet Photoelectron Spectroscopy
      Ultraviolet Photoelectron Spectroscopy (UPS), Spin-resolved

      Research Types
      µ‐SARPES from spatially inhomogeneous samples (artificially formed; polycrystalline or micro‐crystal materials). •XPEEM: full‐field probe for topographic, structural and spectroscopic measurements.

  • Contact Information
    • Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
      Elio Vescovo, Brookhaven National Laboratory,, 344-7399
      Andrew Walter, Brookhaven National Laboratory,, 344-4055

      Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.

      Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.

      Beamline Phone

  • Instrumentation
    • Source Type
      Two in-line undulators: EPU105, EPU57.

      Optical System
      Variable Line Spacing Plane Grating Monochromator (VLS-PGM). Secondary slits. u-ARPES refocusing: KB pair; XPEEM-refocusing: ellipsoidal.

      Experimental Apparatus
      µ‐SARPES branch: • Smaract micro‐scanning stage • Scienta DA30 with 2D mini-Mott • Closed cycle LHe cryostats. XPEEM branch: • Elmitec AC‐LEEM III (Aberration‐Corrected Low Energy Electron Microscope)

      Computer System Hardware & Software
      Beamline componenets are controlled by EPICS 3.14 using VME. The user interface is through Python and Control System Studio (CSS) clients.

  • Links