Beamline 4-ID

  • General Information
    • Source Type
      2.8 m long IVU-23


      General User Beamtime

      Energy Range Category
      Hard X-Ray (1-50 keV)

      Energy Range
      2.4-23 keV

      Beamline Type
      Facility Beamline

      Beamline Description
      ISR supports x-ray scattering techniques (e.g., resonant x-ray scattering, crystal truncation rod measurements, x-ray reflectivity, grazing incidence small-angle x-ray scattering, and grazing incidence diffraction) in order to improve our understanding of novel materials. Specialized optics provide polarization control and microfocusing with a large (~1 m) working distance from the focusing optic, and a flexible range of environment chambers can be accommodated for in-situ studies of materials.

      X-ray Diffraction, Surface
      X-ray Scattering, magnetic
      X-ray Scattering, resonant

      Research Types
      X-ray Scattering in a Magnetic Field, In-situ Materials Growth and Processing, X-ray Scattering

  • Contact Information
    • Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
      Christie Nelson, Brookhaven National Laboratory,, 344-4916

      Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
      Kenneth Evans-Lutterodt, Brookhaven National Laboratory,, 344-2095

      Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.

      Beamline Phone

  • Instrumentation
    • Beamline Characteristics

      Energy RangeMono Crystal or GratingResolution (ΔE/E)FluxSpot Size (mm)Total Angular Acceptance (mrad)
      2.4-23 keV Si(111) DCM ~10-4 ~1013 photons/s variable down to 2 microns (V) x 20 microns (H) 50 microrad (V) x 70 microrad (H)

      Source Type
      2.8 m long IVU-23

      Optical System
      Si(111) DCM; primary focusing optics to focus at any of three endstations or at the SSA, which is ~50 m from the source; polarization control (circular as well as variable linear); harmonic rejection mirror and secondary focusing with KB mirrors.

      Experimental Apparatus
      Three endstations: a 6-circle diffractometer, a base diffractometer that accommodates large magnets, and a base diffractometer that accommodates UHV growth chambers. Displex cryostat; gas handling system; polarization analyzer; point and area detectors, including a Vortex silicon drift detector, Pilatus 100K, and Eiger 1M.

      Computer System Hardware & Software

  • Links