The Submicron Resolution X-ray Spectroscopy beamline, SRX, will enable simultaneous x-ray fluorescence and transmission measurements with sub-µm to sub-100 nm spatial resolution with an incident x-ray beam energy of 4.65-25 keV. X-rays are focused onto the sample by a set of Kirkpatrick-Baez mirrors. Sample stages will enable fast 2D scanning and tomography capabilities. X-ray fluorescence imaging and tomography will provide elemental mapping in 2D and 3D, respectively. Spatially resolved X-ray Absorption Near Edge Structure (XANES) spectroscopy can be performed in fluorescence or transmission mode. Full-field imaging and tomography are also possible to provide morphology information. Several different operation modes including high resolution scanning (sub-100 nm focused beam), high flux (sub-µm focused beam) scanning and full-field imaging are available.