X1A2 External Website

Beamline X1A2

  • General Information
    • Source Type
      35 period planar undulator, minimum gap 32 mm

      Status
      Operational

      General User Beamtime
      25%

      Energy Range Category
      Soft X-Ray (0.1-1 keV)

      Energy Range
      .25-800 keV

      Beamline Type
      Participating Research Team (PRT)

      Beamline Description
      Soft X-ray Reflectifity, Diffraction and Imaging. The X1A2 beamline (along with X1A1 and X1B) are served by an 8-cm-period, 69-pole planar undulator. Both X1A1 and X1A2 share an acceptance of approximately 1 mrad horizontally (the transversely spatially coherent extent of the X1 undulator source) and leave approximately 2/3 the horizontal fan for the X1B beamline. The X1A2 beamline consists of a single toroidal collecting / focussing mirror followed by a ~6m spherical grating monochromator (SGM). The endstation consists of a 6-circle in-vacuum diffractometer capable of performing soft x-ray resonant scattering and diffraction. Diffraction contrast imaging is provided through means of a zone-plate optic.

      Technique(s)
      X-ray scattering, resonant

      Institution(s)
      Brookhaven National Laboratory, CMPMSD

      Research Types
      Soft x-ray imaging. Not available for general users at this time.

  • Contact Information
    • Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
      John Hill, Brookhaven National Laboratory, hill@bnl.gov, 344-3736
      Stuart Wilkins, Brookhaven National Laboratory, swilkins@bnl.gov, 344-2851

      Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
      Vivek Thampy, Brookhaven National Laboratory, vthampy@bnl.gov, 344-2713

      Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
      Stuart Wilkins, Brookhaven National Laboratory, swilkins@bnl.gov, 344-2851

      Beamline Phone
      631-344-3699

  • Instrumentation
    • Beamline Characteristics

      Energy RangeMono Crystal or GratingResolution (ΔE/E)FluxSpot Size (mm)Total Angular Acceptance (mrad)
      250 - 800 eV 892 lines/mm 0.1 eV (@ 540 eV, slits 25/25) 1 x 1018 ph/(sec-0.1%bw-mm2-mrad2)

      Source Type
      35 period planar undulator, minimum gap 32 mm

      Optical System
      Mirror 1: Flat, nickel-coated, 40 mrad grazing angle, water-cooled silicon, 12.95 m from the source. Mirror 2: Toroid, 50 mrad grazing angle, major radii 100.6 m, minor radii 0.426 m, gold-coated, water-cooled silicon. Focused beam horizontally onto entrance slit with a magnification of 0.13 and focused vertically onto the exit slit with a magnification of 0.42. Located 17.8 m from the source Monochromators: One fixed, spherical grating, 3.5 degree included angle, gold-coated with discrete water cooled entrance slits of 10, 25, 40, 70, 120, 200 microns and fixed vertical exit slit with slits sizes of 10, 25, 40,70, 120, 200 microns and variable size horizontal exit slit. Located 21.45 m from the source. Order-Sorting Mirrors: 2 parallel quartz mirrors, vertically deflecting at approx. 3 degree grazing angle, resulting in approx. 1 mm vertical beam offset, used to preferentially absorb higher orders from the source. Located 26 m from the source.

      Experimental Apparatus
      6-Circle Soft X-ray diffractometer and Imaging endstation with zone plate focussing optics and in-vacuum CCD detector. (Access to these instruments by PRT collaboration only. Please contact beam line staff before submitting a proposal.)

      Computer System Hardware & Software
      The X1A2 beamline is fully automated through the use of EPICS based on a mixed Linux/VME vxWorks platform. Diffractometer controls and data acquisition is through SPEC.

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