Beamline X7B

  • General Information
    • Source Type
      Bending magnet


      General User Beamtime

      Energy Range Category
      Hard X-Ray (1-50 keV)

      Energy Range

      Beamline Type
      Participating Research Team (PRT)

      Beamline Description
      Crystallography, wide angle scattering. This beamline is configured with a focusing double crystal bent Laue monochomater. The focus of the beam has a spot size of 0.5 x 1.0 mm; and the energy range is 35 to 50KeV. The monochromator is usually tuned to 40 keV. The hutch is equipped with a Mar345 base on xyz lift table with 500 - 800 lbs. capacity; ionization chamber is used to measure incident beam flux. A Perkin Elmer amorphous silicon detector is used to acquire the 2-D x-ray diffraction pattern.

      X-ray diffraction, single crystal
      X-ray diffraction, time resolved
      X-ray diffraction, wide angle
      X-ray scattering, wide angle

      Brookhaven National Laboratory, Chemistry Dept.
      General Electric - Piscataway

      Research Types
      Crystallography, wide angle scattering, time-resolved powder diffraction and pair distribution studies of catalyst and new materials.

  • Contact Information
    • Spokesperson The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.
      Sanjaya Senanayake, Brookhaven National Laboratory,, 344-4343

      Local Contact The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.
      Sanjaya Senanayake, Brookhaven National Laboratory,, 344-4343

      Beamtime Scheduler The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.
      Sanjaya Senanayake, Brookhaven National Laboratory,, 344-4343

      Beamline Phone

  • Instrumentation
    • Beamline Characteristics

      Energy RangeMono Crystal or GratingResolution (ΔE/E)FluxSpot Size (mm)Total Angular Acceptance (mrad)
      35-50 keV Si(311) 2 x 10-3 1x 1011 ph/sec (calc. @ 35 keV, 500 mA, 2.8 GeV) 0.3H x 1.0V(1% variable for intensity)(design) 2

      Source Type
      Bending magnet

      Optical System
      Monochromator: Focusing 2 bent Laue crystal monochomater.

      Experimental Apparatus
      Radiation hutch. XYZ lift table with 500 - 800 lbs. Capacity. Heaters and controllers for temperatures up to 900C. SRS rare gas analyzer. Flow control for plug flow reactor cell. Scintillation and ionization detectors. Perkin Elmer amorphous silicon detector.

      Computer System Hardware & Software
      LINUX computer for Mar345 detector, PC running LINIX and PC running windows 2000. Software: HKL package, spec, QXRD, FIT2D software.

  • Links