NSLS-II Beamlines

BeamlineTechnique(s)Energy RangeSpokesperson
2-ID X-ray Absorption Spectroscopy
X-ray Inelastic Scattering
165 to 2300 eV Ignace Jarrige
3-ID X-ray Diffraction Micro/Nanoprobe
X-ray Fluorescence Micro/Nanoprobe
6 - 25 keV Yong Chu
4-ID X-ray Diffraction, Surface
X-ray Scattering, magnetic
X-ray Scattering, resonant
2.4-23 keV Christie Nelson
5-ID X-ray Fluorescence Micro/Nanoprobe
X-ray Absorption Spectroscopy, Near Edge Fine Structure
4.65 -25 keV Juergen Thieme
6-ID   Elio Vescovo
7-ID-1 X-ray Absorption Micro/Nanoprobe
X-ray Absorption Spectroscopy, Near Edge Fine Structure
X-ray Photoelectron Spectroscopy
100 eV - 2.2 keV Daniel Fischer
7-ID-2 X-ray Micro/Nano Spectroscopy
X-ray Absorption Spectroscopy, Near Edge Fine Structure
X-ray Photon Correlation Spectroscopy
1 - 7.5 keV Daniel Fischer
8-ID X-ray Absorption Spectroscopy
X-ray Inelastic Scattering
4.9keV-36keV Klaus Attenkofer
10-ID X-ray Inelastic Scattering
5 ~ 15 keV Yong Cai
11-ID X-ray Photon Correlation Spectroscopy
X-ray Scattering, Small- and Wide-angle
6-16 keV Andrei Fluerasu
12-ID X-ray Diffraction, Surface
2.1-24 keV Elaine Dimasi
16-ID X-ray Scattering, Biomolecular Solution
X-ray Scattering, Small- and Wide-angle
2.1-18 keV Lin Yang
17-ID-1 Macromolecular (Protein) Crystallography
5 - 18 keV Dieter Schneider
17-ID-2 Macromolecular (Protein) Crystallography
5 - 30 keV Martin Fuchs
17-BM X-ray Footprinting
5-16 keV Jennifer Bohon
18-ID Transmission X-ray Microscopy
5-11 keV Wah-Keat Lee
19-ID Macromolecular (Protein) Crystallography
6-18 keV Wayne Hendrickson
21-ID X-ray Absorption Micro/Nanoprobe
Ultraviolet Photoelectron Spectroscopy
Ultraviolet Photoelectron Spectroscopy (UPS), Spin-resolved
15 - 1500 eV Elio Vescovo
23-ID-1 X-ray Diffraction, Surface
X-ray Scattering, Coherent
X-ray Scattering, magnetic
X-ray Scattering, resonant
260 eV to 2 keV Stuart Wilkins
23-ID-2 X-ray Absorption Spectroscopy
X-ray Photoelectron Spectroscopy
250 eV to 2 keV Iradwikanari Waluyo
28-ID-1 X-ray Scattering, Small- and Wide-angle
X-ray Total Scattering
39 keV, 64 keV, 75 keV and 117 keV A M Abeykoon
28-ID-2 X-ray Diffraction, Powder
X-ray Scattering, Small- and Wide-angle
X-ray Total Scattering
30-70 keV Eric Dooryhee
3-BM   Kenneth Evans-Lutterodt
4-BM X-ray Absorption Micro/Nanoprobe
X-ray Diffraction Micro/Nanoprobe
X-ray Fluorescence Micro/Nanoprobe
X-ray Micro/Nano Spectroscopy
X-ray Absorption Spectroscopy
X-ray Absorption Spectroscopy, Extended Fine Structure
X-ray Absorption Spectroscopy, Near Edge Fine Structure
X-ray Diffraction, Powder
2 - 23 keV or pink Ryan Tappero
6-BM X-ray Absorption Spectroscopy
X-ray Diffraction, Powder
4.7 – 22 keV Daniel Fischer
7-BM X-ray Absorption Spectroscopy
X-ray Diffraction, Powder
4.7 - 31 keV Steven Ehrlich
8-BM X-ray Absorption Micro/Nanoprobe
X-ray Micro/Nano Spectroscopy
Time-resolved Spectroscopy
X-ray Absorption Spectroscopy
X-ray Absorption Spectroscopy, Extended Fine Structure
X-ray Absorption Spectroscopy, Near Edge Fine Structure
1-8 keV Paul Northrup
11-BM X-ray Scattering, Small- and Wide-angle
X-ray Scattering, Surface
10-17 keV Masafumi Fukuto
22-BM-1 Infrared microspectroscopy
High Pressure Research
Infrared Spectroscopy
0.5 meV to 3 eV G Carr
22-BM-2 Infrared transmission and reflection spectroscopy
Magnetospectroscopy
Spectroscopic Ellipsometry
THz / millimeter wave spectroscopy
Time-resolved Spectroscopy
0.6 meV to 5 eV G Carr
24-BM   Jeffrey Keister
28-BM X-ray Diffraction, Powder
X-ray Diffraction, Single Crystal
X-ray Diffraction, Time Resolved
X-ray Reflectivity
6-25 keV Jianming Bai